FIB/SEM Specialist

Job Summary

Radiance Technologies, a rapidly growing employee‑owned company, is seeking a skilled candidate to join our Cyber Solutions Group. This individual will perform integrated circuit (IC) failure analysis with a primary focus on Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) techniques. They will develop failure analysis (FA) methodologies for a wide range of IC designs and technology nodes ranging from 300nm down to 10nm and smaller. The role requires configuring laboratory test and measurement equipment, proficiency in operating SEMs and FIBs, and other standard FA laboratory tools. They will also document standard operating procedures for tools, processes, and techniques. Experience with optical systems and sample preparation equipment is a plus.
Required Skills

Bachelor’s Degree
US citizenship with the ability to obtain a security clearance
Required Experience

Minimum of 5 years operating, maintaining, or servicing SEMs and FIBs.
Desired Qualifications

Experience with Thermo Fisher Systems
Experience maintaining or servicing FA lab equipment
Experience with circuit edit and sample preparation techniques
Experience with IC failure analysis
Experience with nano probing
Experience with soldering
Experience with optical systems and sample preparation equipment
Active Secret Clearance (or above)
Clearance

Applicants selected may be subject to a government security investigation and must meet eligibility requirements for access to classified information.
Equal Opportunity

Radiance Technologies is an Equal Opportunity Employer. All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, gender identity, national origin, disability, or protected veteran status.

#J-18808-Ljbffr