Postdoctoral Fellow (PREP0004220)
The American Ceramic Society, Gaithersburg, MD, United States
General Description
PREP Research Associate – CHIPS Funded Project. This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). It involves supporting the NIST/CHIPS Nanometer‑Scale Planar Reference Materials project by conducting technical work that aligns with the collaboration’s scientific research goals.
Research Title
Nanometer‑Scale Planar Reference Materials (U.S. Citizens Preferred)
Key Responsibilities
Plan and conduct research on advanced X‑ray metrologies to determine structural (physical and chemical) properties of blanket (non‑patterned) thin films on Si and SiC wafers.
Use lab‑based and synchrotron X‑ray characterization methods to determine the structural properties of thin‑film samples.
Use open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials.
Publish results in archival scientific journals and present results at topical meetings.
Qualifications
Qualified persons (U.S. Citizens preferred) with experience in advanced metrology, X‑ray characterization, data analysis, and wafer processing will be considered. The candidate will measure and analyze wafers using X‑ray and optical methods to produce structural maps for thin films of interest to the semiconductor community.
Application Instructions
Please upload the following with your application:
CV/Resume (maximum 3 pages, include a valid email address)
Self portraits
Phone number
Home address/Country
Citizenship status
Languages spoken
Sex/Gender
Equal Opportunity Employer
The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students. The university does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status or other legally protected characteristic.
#J-18808-Ljbffr
PREP Research Associate – CHIPS Funded Project. This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). It involves supporting the NIST/CHIPS Nanometer‑Scale Planar Reference Materials project by conducting technical work that aligns with the collaboration’s scientific research goals.
Research Title
Nanometer‑Scale Planar Reference Materials (U.S. Citizens Preferred)
Key Responsibilities
Plan and conduct research on advanced X‑ray metrologies to determine structural (physical and chemical) properties of blanket (non‑patterned) thin films on Si and SiC wafers.
Use lab‑based and synchrotron X‑ray characterization methods to determine the structural properties of thin‑film samples.
Use open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials.
Publish results in archival scientific journals and present results at topical meetings.
Qualifications
Qualified persons (U.S. Citizens preferred) with experience in advanced metrology, X‑ray characterization, data analysis, and wafer processing will be considered. The candidate will measure and analyze wafers using X‑ray and optical methods to produce structural maps for thin films of interest to the semiconductor community.
Application Instructions
Please upload the following with your application:
CV/Resume (maximum 3 pages, include a valid email address)
Self portraits
Phone number
Home address/Country
Citizenship status
Languages spoken
Sex/Gender
Equal Opportunity Employer
The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students. The university does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status or other legally protected characteristic.
#J-18808-Ljbffr