Postdoc: X-ray Metrology for Nanometer-Scale Planar Materials

The American Ceramic Society seeks a Research Associate for the NIST/CHIPS Nanometer‑Scale Planar Reference Materials project in Gaithersburg, MD. The role involves conducting research using advanced X-ray metrologies, analyzing structural properties of thin films, and publishing findings. Ideal candidates will have experience in metrology and wafer processing, and be proficient in data analysis using Python. Strong communication and publication skills are essential for success in this collaborative research environment.
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