X-ray Metrology Fellow: Semiconductor Thin Films

The American Ceramic Society in Gaithersburg, MD, seeks a PREP Research Associate within NIST for a CHIPS funded project. The role involves conducting research on X-ray metrologies and analyzing thin films on Si and SiC wafers. Candidates must hold a Ph.D. in physics or materials science, have experience in X-ray techniques and programming in Python, and possess strong communication skills. This position offers competitive compensation and comprehensive benefits including health and retirement options.
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